전문화, 실효성, 연계성, 집중화를 통한 “신기술 가치창출”을 실현합니다. Electromagnetic Wave Technology Institute

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기술자료 제목 Resonance analysis for EMC improvement in integrated circuits
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Resonance analysis for EMC improvement in integrated circuits


* 저자
Y. Bacher ; STMicroelectron., Rousset, France ; N. Froidevaux ; P. Dupre ; H. Braquet


* 개요
To be compliant with electromagnetic compatibility standards, integrated circuits such as microcontrollers have to be robust to fast transient burst tests. Because of high voltage and fast transient voltage variations used no measurement is possible during the stress. Lack of information makes the debug of a product a real challenge. The objective of this work is to provide a measurement method which permits to have more information on the stress propagation on the power supply network. The methodology applied here on fast transient burst test could be extended to other kind of stress on power supply.


* 출처
o Published in:Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop on the
o Date of Conference:10-13 Nov. 2015
o Page(s):56 - 60


* 바로가기
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7358330&queryText=emc&refinements=4291944822&refinements=4291944246&refinements=undefined&ranges=2015_2015_Year&pageNumber=2


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